RTA?s micro-graphical analysis of grain structures is an ideal platform for forensic investigation of component failures, assessment of effective hardening depths and identification of structural fatigue at a microscopic level.

Scanning electron microscopy (SEM) is a sophisticated method of viewing material samples at a minute scale (microns). RTA can conduct SEM studies for many industrial and research related purposes. More common applications include analysis of failure and wear mechanisms.

X-Ray Fluorescence (XRF) is a chemical composition analysis method that identifies the major (wt%) and trace (ppm) levels of in-organic elements in solid samples. RTA can facilitate XRF analysis for the purpose of identifying sample compositions and the likely material specifications.